Introduction to techniques in determining the composition and structure of materials on the nanometer scale. Characterization of atomic, meso-, and micro-structure of materials including impurities and defects. Major topics will include electron microscopy (transmission, scanning, and Auger) and associated spectroscopies (EDX, EELS), surface sensitive spectroscopies (e.g., XPS, AES, IR) and spectrometry (SIMS), synchrotron techniques, X-ray absorption, fluorescence and emission, and scanned probe microscopies (AFM, STM, etc.). The techniques will be examined through real-world nanotechnology case studies. Not open to students with credit in CHEM 444.