Production testing versus design verification of digital VLSI/ULSI systems. Economics of testing. Defect distributions, yield analysis, and minimum fault coverage requirements. Fault modelling, fault simulation, and automatic test pattern generation. Memory testing. Iddq current-based testing. Design for testability (DFT) rules and strategies. Scan chain based DFT. Built-in self-test (BIST) circuits and architectures. The IEEE JTAG boundary scan and embedded core test standards. Advanced testing topics.
| Section | Capacity | Class times | Instructor(s) |
|---|---|---|---|
|
LECTURE B1
(19060) |
12 |
2024-01-08 - 2024-04-12 (MWF)
10:00 - 10:50
NRE 2-016
|
Primary Instructor: Bruce Cockburn
|