Principles and design of the scanning electron microscope, electron beam-specimen interactions, image formation, x-ray microanalysis in the scanning electron microscope, specimen preparation, application to materials analysis. Prerequisite: Consent of Instructor.
| Section | Capacity | Class times | Login to view Instructor(s) and Location |
|---|---|---|---|
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LECTURE A1
(53148) |
40 |
2024-09-03 - 2024-12-09 (MWF)
11:00 - 11:50
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