Principles and design of the scanning electron microscope, electron beam-specimen interactions, image formation, x-ray microanalysis in the scanning electron microscope, specimen preparation, application to materials analysis. Prerequisite: Consent of Instructor.
| Section | Capacity | Class times | Instructor(s) | |||
|---|---|---|---|---|---|---|
|
LECTURE A1
(89276) |
30 |
|
Primary Instructor: Douglas G Ivey
|