MAT E 666 - Materials Applications of Scanning Electron Microscopy

★ 3 (fi 6)(EITH/SP/SU, 3-0-0)

Faculty of Engineering

Principles and design of the scanning electron microscope, electron beam-specimen interactions, image formation, x-ray microanalysis in the scanning electron microscope, specimen preparation, application to materials analysis. Prerequisite: Consent of Instructor.

No syllabi