Samuel Baird

ATS Assistant Lecturer, Faculty of Science - Chemistry
Directory
No past terms No future terms

Fall Term 2024 (1890)

CHEM 101 - Introductory University Chemistry I

3 units (fi 6)(EITHER, 3-1S-3/2)

Atoms and molecules, states of matter, chemistry of the elements. Prerequisite: Chemistry 30, or equivalent.

LECTURE A4 (47429)

2024-09-03 - 2024-12-09
TR 14:00 - 15:20

Winter Term 2025 (1900)

CHEM 102 - Introductory University Chemistry II

3 units (fi 6)(EITHER, 3-1S-3/2)

Rates of reactions, thermodynamics and equilibrium, electro-chemistry, modern applications of chemistry. Prerequisite: CHEM 101 or 103.

LECTURE B3 (72902)

2025-01-06 - 2025-04-09
MWF 13:00 - 13:50



CHEM 444 - Characterization Methods in Nanoscience

3 units (fi 6)(EITHER, 3-0-0)

Introduction to techniques in determining the composition and structure of materials on the nanometer scale. Characterization of atomic, meso-, and microstructure of materials including impurities and defects. Major topics will include electron microscopy (transmission, scanning, and Auger) and associated spectroscopies (EDX, EELS), surface sensitive spectroscopies (e.g., XPS, AES, IR) and spectrometry (SIMS), synchrotron techniques, X-ray absorption, fluorescence and emission, and scanned probe microscopies (AFM, STM, etc.). The strengths, weaknesses, and complementarity of the techniques used will be examined via case studies on the characterization of real-world nanotechnologies, such as heterogeneous catalysts, surfaces and interfaces in semiconductor devices, organic monolayers on metals and semiconductors, nanotube- and nanowire-based electronics, and biocompatible materials. Prerequisite: 4th year standing or consent of instructor.

LECTURE B1 (77682)

2025-01-06 - 2025-04-09
TR 11:00 - 12:20



CHEM 544 - Characterization Methods in Nanoscience

3 units (fi 6)(EITHER, 3-0-0)

Introduction to techniques in determining the composition and structure of materials on the nanometer scale. Characterization of atomic, meso-, and micro-structure of materials including impurities and defects. Major topics will include electron microscopy (transmission, scanning, and Auger) and associated spectroscopies (EDX, EELS), surface sensitive spectroscopies (e.g., XPS, AES, IR) and spectrometry (SIMS), synchrotron techniques, X-ray absorption, fluorescence and emission, and scanned probe microscopies (AFM, STM, etc.). The techniques will be examined through real-world nanotechnology case studies. Not open to students with credit in CHEM 444.

LECTURE B1 (77683)

2025-01-06 - 2025-04-09
TR 11:00 - 12:20